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Refractive Index and Low-Frequency Dielectric Constant of 6H SiC

The ordinary refractive index of 6H SiC has been measured from 2.43 µ (0.51 eV) to 0.336 µ (3.69 eV), using the transmission interference fringes of thin plates. Thibault’s data in the visible were used to normalize the dispersion curve. The index goes from 2.530 at 0.51 eV to 2.868 at 3.69 eV. The residual-ray and interband contributions to the index are evaluated. The extrapolated interband index plus residual-ray contribution yield a low-frequency dielectric constant of 9.8, compared with a measured 10.2. As possible reasons for the disagreement, four allowed but unreported infrared transitions are considered.

Source:OSA

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